Atomic force microscopy (AFM), transmission electron microscopy (TEM) and scanning electron microscopy (SEM) of nanoscale plate-shaped second phase particles
نویسندگان
چکیده
منابع مشابه
Study of Transmission Electron Microscopy (TEM) and Scanning Electron Microscopy (SEM)
Scanning electron microscopy (SEM) and transmission electron microscopy (TEM) are widely used in material science, metallurgy sicence and life science researches. TEM is an imaging technique where a beam of electrons is focused onto a specimen causing an enlarged version to appear on a fluorescent screen or layer of photographic film. SEM is a technique of electron microscope to produce high re...
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ژورنال
عنوان ژورنال: Philosophical Magazine
سال: 2007
ISSN: 1478-6435,1478-6443
DOI: 10.1080/14786430701203184